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TESA TECHNOLOGY Optical flats with two parallel faces sets
For outside micrometers 0-100 mm
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Application
For simultaneously measuring the parallelism and flatness of flat measuring surfaces on outside micrometers and dial snap gauges using the interference method
Execution
- with different thicknesses for parallelism testing in different spindle positions (for rotating measuring spindles)
- For outside micrometers with 0.5 mm thread pitch
Notes
Note: Set 0-25 mm 4 pieces. Sets 25-100 mm 3 pieces in each
Delivery
in case
Select RAL-colour code
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